Ti2SnC and Ti2InC Nanolaminates by Low Energy Ion Facility (LEIF) and Their Resistance Towards Ar+ Ion Bombardment
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چکیده
منابع مشابه
Concentration micropro®les in iron silicides induced by low energy Ar ion bombardment
Auger electron spectroscopy (AES) in conjunction with sputter removal by Ar ions of only 120 eV has been used to determine the concentration micropro®les generated in polycrystalline Fe3Si, FeSi and FeSi2 samples by a preceding bombardment with Ar ions of 1±5 keV. The conversion of the surface sensitive AES ptp-signals measured in dependence of the pro®ling ion ̄uence into concentration-versu...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2019
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927619008882